License: Creative Commons Attribution 4.0 International license (CC BY 4.0)
When quoting this document, please refer to the following
DOI: 10.4230/LIPIcs.ITCS.2023.20
URN: urn:nbn:de:0030-drops-175231
URL: http://dagstuhl.sunsite.rwth-aachen.de/volltexte/2023/17523/
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Bodwin, Greg ; Dinitz, Michael ; Nazari, Yasamin

Epic Fail: Emulators Can Tolerate Polynomially Many Edge Faults for Free

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LIPIcs-ITCS-2023-20.pdf (0.7 MB)

Abstract

A t-emulator of a graph G is a graph H that approximates its pairwise shortest path distances up to multiplicative t error. We study fault tolerant t-emulators, under the model recently introduced by Bodwin, Dinitz, and Nazari [ITCS 2022] for vertex failures. In this paper we consider the version for edge failures, and show that they exhibit surprisingly different behavior.
In particular, our main result is that, for (2k-1)-emulators with k odd, we can tolerate a polynomial number of edge faults for free. For example: for any n-node input graph, we construct a 5-emulator (k = 3) on O(n^{4/3}) edges that is robust to f = O(n^{2/9}) edge faults. It is well known that Ω(n^{4/3}) edges are necessary even if the 5-emulator does not need to tolerate any faults. Thus we pay no extra cost in the size to gain this fault tolerance. We leave open the precise range of free fault tolerance for odd k, and whether a similar phenomenon can be proved for even k.

BibTeX - Entry

@InProceedings{bodwin_et_al:LIPIcs.ITCS.2023.20,
  author =	{Bodwin, Greg and Dinitz, Michael and Nazari, Yasamin},
  title =	{{Epic Fail: Emulators Can Tolerate Polynomially Many Edge Faults for Free}},
  booktitle =	{14th Innovations in Theoretical Computer Science Conference (ITCS 2023)},
  pages =	{20:1--20:22},
  series =	{Leibniz International Proceedings in Informatics (LIPIcs)},
  ISBN =	{978-3-95977-263-1},
  ISSN =	{1868-8969},
  year =	{2023},
  volume =	{251},
  editor =	{Tauman Kalai, Yael},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/opus/volltexte/2023/17523},
  URN =		{urn:nbn:de:0030-drops-175231},
  doi =		{10.4230/LIPIcs.ITCS.2023.20},
  annote =	{Keywords: Emulators, Fault Tolerance, Girth Conjecture}
}

Keywords: Emulators, Fault Tolerance, Girth Conjecture
Collection: 14th Innovations in Theoretical Computer Science Conference (ITCS 2023)
Issue Date: 2023
Date of publication: 01.02.2023

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