License: Creative Commons Attribution 4.0 International license (CC BY 4.0)
When quoting this document, please refer to the following
DOI: 10.4230/LIPIcs.ITCS.2023.10
URN: urn:nbn:de:0030-drops-175130
URL: http://dagstuhl.sunsite.rwth-aachen.de/volltexte/2023/17513/
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Baig, Mirza Ahad ; Chakraborty, Suvradip ; Dziembowski, Stefan ; Gałązka, Małgorzata ; Lizurej, Tomasz ; Pietrzak, Krzysztof

Efficiently Testable Circuits

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LIPIcs-ITCS-2023-10.pdf (1 MB)

Abstract

In this work, we put forward the notion of "efficiently testable circuits" and provide circuit compilers that transform any circuit into an efficiently testable one. Informally, a circuit is testable if one can detect tampering with the circuit by evaluating it on a small number of inputs from some test set.
Our technical contribution is a compiler that transforms any circuit C into a testable circuit (Ĉ,?̂) for which we can detect arbitrary tampering with all wires in Ĉ. The notion of a testable circuit is weaker or incomparable to existing notions of tamper-resilience, which aim to detect or even correct for errors introduced by tampering during every query, but our new notion is interesting in several settings, and we achieve security against much more general tampering classes - like tampering with all wires - with very modest overhead.
Concretely, starting from a circuit C of size n and depth d, for any L (think of L as a small constant, say L = 4), we get a testable (Ĉ,?̂) where Ĉ is of size ≈ 12n and depth d+log(n)+L⋅ n^{1/L}. The test set ?̂ is of size 4⋅ 2^L. The number of extra input and output wires (i.e., pins) we need to add for the testing is 3+L and 2^L, respectively.

BibTeX - Entry

@InProceedings{baig_et_al:LIPIcs.ITCS.2023.10,
  author =	{Baig, Mirza Ahad and Chakraborty, Suvradip and Dziembowski, Stefan and Ga{\l}\k{a}zka, Ma{\l}gorzata and Lizurej, Tomasz and Pietrzak, Krzysztof},
  title =	{{Efficiently Testable Circuits}},
  booktitle =	{14th Innovations in Theoretical Computer Science Conference (ITCS 2023)},
  pages =	{10:1--10:23},
  series =	{Leibniz International Proceedings in Informatics (LIPIcs)},
  ISBN =	{978-3-95977-263-1},
  ISSN =	{1868-8969},
  year =	{2023},
  volume =	{251},
  editor =	{Tauman Kalai, Yael},
  publisher =	{Schloss Dagstuhl -- Leibniz-Zentrum f{\"u}r Informatik},
  address =	{Dagstuhl, Germany},
  URL =		{https://drops.dagstuhl.de/opus/volltexte/2023/17513},
  URN =		{urn:nbn:de:0030-drops-175130},
  doi =		{10.4230/LIPIcs.ITCS.2023.10},
  annote =	{Keywords: circuit compilers, circuit integrity, circuit testing}
}

Keywords: circuit compilers, circuit integrity, circuit testing
Collection: 14th Innovations in Theoretical Computer Science Conference (ITCS 2023)
Issue Date: 2023
Date of publication: 01.02.2023

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